发明名称 SOLID-STATE IMAGING ELEMENT INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a solid-state imaging element inspection system with a high degree of freedom of design capable of easily coping with even type revision of an inspection object product. <P>SOLUTION: The solid-state imaging element inspection system wherein image processing sections are connected to a solid-state imaging element inspection apparatus is characterized by including: a control memory that stores a plurality of sets of programs and parameters operated on the inspection apparatus depending on types of inspection objects and stores a plurality of sets of software programs and parameters for driving the image processing sections as data sets in response to the types of the inspection objects; a means for entering a prescribed data set switching instruction corresponding to the types of the solid-state imaging element being the inspection object for the purpose of setting; and a means for transferring the data set read from the control memory to a plurality of the image processing sections according to the data set switching instruction, and each of the image processing sections is provided with a control means for starting a prescribed image processing software program on the basis of the transfered data set. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006203388(A) 申请公布日期 2006.08.03
申请号 JP20050011075 申请日期 2005.01.19
申请人 YOKOGAWA ELECTRIC CORP 发明人 UCHIDA AKIHIRO
分类号 H04N17/00;H01L27/14;H04N5/335 主分类号 H04N17/00
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