发明名称 |
Probe card for testing a plurality of semiconductor chips and method thereof |
摘要 |
A probe card for that may be used to test a plurality of semiconductor chips formed on a wafer. The probe card may include a substrate; a plurality of probe blocks that form a pattern corresponding to the pattern formed by the plurality of semiconductor chips formed on the wafer; and a plurality of probe needles formed in the probe blocks and arranged in a pattern corresponding to a plurality of pads formed in the plurality of semiconductor chips. The use of the probe card may decrease the testing time for the wafer.
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申请公布号 |
US2006170437(A1) |
申请公布日期 |
2006.08.03 |
申请号 |
US20060330399 |
申请日期 |
2006.01.12 |
申请人 |
YOO SANG-KYU;KANG KI-SANG;KIM HOON-JUNG;KANG SUNG-MO;CHO CHANG-HYUN |
发明人 |
YOO SANG-KYU;KANG KI-SANG;KIM HOON-JUNG;KANG SUNG-MO;CHO CHANG-HYUN |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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