发明名称 POLISHING AGENT AND METHOD OF POLISHING SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing agent which has high practicality as an object for shallow trench isolation and is capable of polishing without causing scratches, and a method for polishing a surface of a substrate to be polished with high practicality as an object for shallow trench isolation without causing scratches. <P>SOLUTION: The polishing agent comprises abrasive grains, an amino-acid surface active agent and water, and when using it, a ratio of silicon oxide film polishing speed to silicon nitride film polishing speed is 100 or above. In the method for polishing a substrate, a substrate on which a film to be polished is formed is pressed against a polishing cloth of a polishing plate, and then the polishing agent is supplied between the film to be polished and the polishing cloth while moving the substrate and the polishing plate to polish the film to be polished. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006203235(A) 申请公布日期 2006.08.03
申请号 JP20060059738 申请日期 2006.03.06
申请人 HITACHI CHEM CO LTD 发明人 AKAHORI SATOHIKO;ASHIZAWA TORANOSUKE;HIRAI KEIZO;KURIHARA YOSHIO
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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