发明名称 METHOD AND APPARATUS FOR INSPECTING BGA PACKAGE
摘要 PROBLEM TO BE SOLVED: To provide a method for carrying out a total inspection of bonding conditions of solder balls loaded in a BGA package. SOLUTION: A bottom face of a pressing jig 3 is lowered to a certain height from a bonding face of balls of a BGA package substrate 1 by a pressing head (refer to Fig. 3(a)), so as to take a portion of 2/3 or more of a solder ball 2 into holes 4 of the pressing jig 3 (refer to Fig. 3(b)). A sharing stress of approximately 10% of a diameter of solder balls is applied to solder balls 2 by vibrating a substrate stage 6, and unsuitable solder balls 7 separated from the substrate are removed by lifting while being sucked through the suction hole 5 of the pressing jig 3 (refer to Fig. 3(d)). COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006203153(A) 申请公布日期 2006.08.03
申请号 JP20050101168 申请日期 2005.03.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OKAMURA MOTOTSUGU;NARAOKA HIROKI
分类号 H01L23/12 主分类号 H01L23/12
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