发明名称 JITTER MEASUREMENT DEVICE AND JITTER MEASUREMENT METHOD
摘要 <p>An orthogonal signal generating unit converts a signal to be measured into two orthogonal signals which are two signals whose phases are orthogonal to one another. An instantaneous phase calculating unit calculates an instantaneous phase based on the two orthogonal signals within a range between a lower limit phase value set in advance and an upper limit phase value set in advance. A differential value detecting unit detects a differential value of the instantaneous phase. A differential value correcting unit corrects the differential value, and outputs a corrected differential value when the differential value of the instantaneous phase is over the range dependent on the lower limit phase value and the upper limit phase value. An offset component eliminating unit eliminates an offset component included in the corrected differential value from the corrected differential value output from the differential value correcting unit, and outputs a differential value from which the offset component has been eliminated. An integration unit determines a jitter amount of the signal to be measured by integrating the differential value which is output from the offset component eliminating unit, and from which the offset component has been eliminated.</p>
申请公布号 EP1686384(A1) 申请公布日期 2006.08.02
申请号 EP20040793237 申请日期 2004.10.29
申请人 ANRITSU CORPORATION 发明人 MOCHIZUKI, KEN
分类号 G01R29/26;G01R29/02;H04L25/02 主分类号 G01R29/26
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