发明名称 Nitride based semiconductor device
摘要 The present invention provides a nitride based semiconductor device comprising an active layer having a quantum well layer and a quantum barrier layer, wherein the device includes an electron emitting layer formed of at least two repeats of a first nitride semiconductor layer and a second nitride semiconductor layer having different compositions between a n-type nitride semiconductor layer and the active layer, the first nitride semiconductor layer has an energy band gap greater than that of the quantum well layer, smaller than that of the quantum barrier layer, and decreasing closer to the active layer, and the second nitride semiconductor layer has an energy band gap at least higher than that of the adjacent first nitride semiconductor layer(s) and has a thickness capable of tunneling electrons.
申请公布号 US7084420(B2) 申请公布日期 2006.08.01
申请号 US20050098278 申请日期 2005.04.04
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM SUN WOON;CHO DONG HYUN;KIM JE WON;LEE KYU HAN;OH JEONG TAK;KIM DONG JOON
分类号 H01L29/06;H01L33/06;H01L31/072;H01L33/32 主分类号 H01L29/06
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