发明名称 Circuits with a trench capacitor having micro-roughened semiconductor surfaces
摘要 A method for forming a trench capacitor. The method includes forming a trench in a semiconductor substrate. A conformal layer of semiconductor material is deposited in the trench. The surface of the conformal layer of semiconductor material is roughened. An insulator layer is formed outwardly from the roughened, conformal layer of semiconductor material. A polycrystalline semiconductor plate is formed outwardly from the insulator layer in the trench.
申请公布号 US7084451(B2) 申请公布日期 2006.08.01
申请号 US19990467992 申请日期 1999.12.20
申请人 发明人
分类号 H01L27/108;H01L21/02;H01L21/334;H01L21/8242 主分类号 H01L27/108
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