发明名称 |
Method of manufacturing semiconductor device, film-forming apparatus, and storage medium |
摘要 |
In a decompressed atmosphere and a heating atmosphere, a vapor of a hafnium organic compound is reacted with, e.g., a disilane gas in a reacting vessel, so as to form a hafnium silicate film on a silicon film. By reacting a dichlorosilane gas with a dinitrogen oxide gas, a silicon oxide film as a barrier layer is laminated on the hafnium silicate film. A polysilicon film as a gate electrode is formed on the silicon oxide film.
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申请公布号 |
US7084023(B2) |
申请公布日期 |
2006.08.01 |
申请号 |
US20040976320 |
申请日期 |
2004.10.29 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
NAKAJIMA SHIGERU;CHOI DONG-KYUN;FUJIWARA TOMONORI;IKEGAWA HIROAKI;NAKAMURA GENJI |
分类号 |
H01L21/336;H01L21/28;H01L21/8234;H01L29/51;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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