发明名称 Method of manufacturing semiconductor device, film-forming apparatus, and storage medium
摘要 In a decompressed atmosphere and a heating atmosphere, a vapor of a hafnium organic compound is reacted with, e.g., a disilane gas in a reacting vessel, so as to form a hafnium silicate film on a silicon film. By reacting a dichlorosilane gas with a dinitrogen oxide gas, a silicon oxide film as a barrier layer is laminated on the hafnium silicate film. A polysilicon film as a gate electrode is formed on the silicon oxide film.
申请公布号 US7084023(B2) 申请公布日期 2006.08.01
申请号 US20040976320 申请日期 2004.10.29
申请人 TOKYO ELECTRON LIMITED 发明人 NAKAJIMA SHIGERU;CHOI DONG-KYUN;FUJIWARA TOMONORI;IKEGAWA HIROAKI;NAKAMURA GENJI
分类号 H01L21/336;H01L21/28;H01L21/8234;H01L29/51;H01L29/78 主分类号 H01L21/336
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