发明名称 METHOD FOR PROCESSING SUBSTRATE
摘要 Disclosed is a method for processing substrate which enables an insulating film formed by a plasma CVD method using an organic silane gas to have a low dielectric constant and to maintain mechanical strength. A method for processing substrate comprising a film-forming step wherein an insulating film is formed on a substrate to be processed by supplying a first process gas containing an organic silane gas onto the substrate and exciting a plasma thereon, and a post-treatment step following the film-forming step wherein the insulating film is treated by supplying a second process gas containing an H2 gas onto the substrate and exciting a plasma thereon is characterized in that the plasma excitation in the post-treatment step is carried out by means of a microwave plasma antenna.
申请公布号 KR20060085953(A) 申请公布日期 2006.07.28
申请号 KR20067009109 申请日期 2006.05.10
申请人 TOKYO ELECTRON LIMITED 发明人 KASHIWAGI YUSAKU;OSHIMA YASUHIRO;KAGAWA YOSHIHISA;CHUNG, GI SHI
分类号 H01L21/205;C23C16/40;C23C16/56;H01L21/306;H01L21/3065;H01L21/312 主分类号 H01L21/205
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