发明名称 |
METHOD FOR PROCESSING SUBSTRATE |
摘要 |
Disclosed is a method for processing substrate which enables an insulating film formed by a plasma CVD method using an organic silane gas to have a low dielectric constant and to maintain mechanical strength. A method for processing substrate comprising a film-forming step wherein an insulating film is formed on a substrate to be processed by supplying a first process gas containing an organic silane gas onto the substrate and exciting a plasma thereon, and a post-treatment step following the film-forming step wherein the insulating film is treated by supplying a second process gas containing an H2 gas onto the substrate and exciting a plasma thereon is characterized in that the plasma excitation in the post-treatment step is carried out by means of a microwave plasma antenna.
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申请公布号 |
KR20060085953(A) |
申请公布日期 |
2006.07.28 |
申请号 |
KR20067009109 |
申请日期 |
2006.05.10 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
KASHIWAGI YUSAKU;OSHIMA YASUHIRO;KAGAWA YOSHIHISA;CHUNG, GI SHI |
分类号 |
H01L21/205;C23C16/40;C23C16/56;H01L21/306;H01L21/3065;H01L21/312 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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