发明名称 Ion implantation cooling system
摘要 An ion implantation cooling system at least comprises a semiconductor substrate utilized as the ion implantation substrate, a Pelier thermoelectric pump connected with the semiconductor substrate for heat irradiation during the ion implantation, and a heatsink connected to the Pelier thermoelectric pump for heat irradiation from a hot Pelier surface during the ion implantation. The cooling system is to employ the Pelier thermoelectric pump enabling the semiconductor substrate and the semiconductor substrate surface being at a temperature lower than that of the heatsink, so the object of proceeding ion implanting at a lower temperature can be achieved thereby.
申请公布号 US2006163490(A1) 申请公布日期 2006.07.27
申请号 US20060334429 申请日期 2006.01.19
申请人 ADVANCED ION BEAM TECHNOLOGY INC. 发明人 TANG DANIEL;CHEN JIONG;LIN WEI-CHENG
分类号 H01J37/20 主分类号 H01J37/20
代理机构 代理人
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