| 摘要 |
In one embodiment, a method of analyzing a semiconductor processing solution having at least one organic additive includes the acts of: (a) spiking a sample of the semiconductor processing solution with a first spike corresponding to the at least one organic additive and a second spike corresponding to at least one organic breakdown product of the organic additive; (b) processing the sample through a mass spectrometer to form an organic additive response, a first spike response, a breakdown response, and a second spike response; and (c) in a processor, calculating a concentration of the at least one organic additive using a ratio measurement derived from the organic additive response and the first spike response and calculating a concentration of the at least one organic breakdown product using a ratio measurement derived from the breakdown response and the second spike response.
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