发明名称 EDDY CURRENT FLAW DETECTION MULTI-COIL PROBE AND ITS MANUFACURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an eddy current flaw detection multi-coil probe and its manufacturing method for reducing an increase in a sensitivity fluctuation by reducing a lift-off fluctuation of flaw detection coils, and improving the inspection accuracy. SOLUTION: The eddy current flaw detection multi-coil probe 1 is provided with a plurality of the flaw detection coils having wound conductors, a holding section with a coating layer having a face 10a opposite to an inspected face and bringing the inspected face into contact with a coil holder 10 for accommodating the flaw detection coils in a state to direct end faces of the detection searching coils to the face 10a, and a housing 13 for supporting and relatively moving the coil holder 10 in at least one direction when a temperature changes. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006194815(A) 申请公布日期 2006.07.27
申请号 JP20050008829 申请日期 2005.01.17
申请人 OLYMPUS CORP 发明人 KONDO YOSHINORI
分类号 G01N27/90 主分类号 G01N27/90
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