发明名称 Recovery processing method to be adopted in substrate processing apparatus, substrate processing apparatus and program
摘要 The present invention provides a recovery processing method to restore the substrate processing apparatus to an operating state after correcting an abnormality having occurred in the substrate processing apparatus in operation and having resulted in a stop in the operation, comprising a substrate retrieval step in which substrate salvage processing is first executed for a wafer W left in a chamber in the substrate processing apparatus in correspondence to the extent to which the wafer has been processed at the time of the operation stop and the substrate having undergone the substrate salvage processing is then retrieved into the cassette storage container and an apparatus internal state restoration step in which the states inside the individual chambers of the substrate processing apparatus are restored.
申请公布号 US2006162660(A1) 申请公布日期 2006.07.27
申请号 US20060337464 申请日期 2006.01.24
申请人 TOKYO ELECTRON LIMITED 发明人 SHIMIZU NORIAKI
分类号 C23C16/00;C23F1/00;H01L21/306;H01L21/66 主分类号 C23C16/00
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