发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>A semiconductor device is provided with a semiconductor substrate (200); ONO films (210, 212, 216) formed on the semiconductor substrate; a control gate (280) on the ONO films; first low resistance layers (250); and second low resistance layers (252) which are brought into contact with the first low resistance layers and are consecutively formed in a current flowing direction. The second low resistance layers have a smaller sheet resistance than that of the first low resistance layers. Thus, the semiconductor device wherein resistance of a bit line is prevented from becoming high, a memory cell can be microminiaturized, and the peripheral circuit manufacturing process is easy, and a method for manufacturing such semiconductor device are provided.</p> |
申请公布号 |
WO2006077650(A1) |
申请公布日期 |
2006.07.27 |
申请号 |
WO2005JP00875 |
申请日期 |
2005.01.24 |
申请人 |
SPANSION LLC;SPANSION JAPAN LIMITED;KOUKETSU, HIROAKI;HOSAKA, MASAYA |
发明人 |
KOUKETSU, HIROAKI;HOSAKA, MASAYA |
分类号 |
H01L21/8247;H01L27/115;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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