发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor layer in which a primary part of a FinFET is formed, i.e., a fin has a shape which is long in a direction x and short in a direction y. A width of the fin in the direction y changes on three stages. First, in a channel area between gate electrodes each having a gate length Lg, the width of the fin in the direction y is Wch. Further, the width of the fin in the direction y in a source/drain extension area adjacent to the channel area in the direction x is Wext (>Wch). Furthermore, the width of the fin in the direction y in a source/drain area adjacent to the source/drain extension area in the direction x is Wsd (>Wext).
申请公布号 US2006166456(A1) 申请公布日期 2006.07.27
申请号 US20060388523 申请日期 2006.03.25
申请人 FUJIWARA MAKOTO;ISHIMARU KAZUNARI;HOKAZONO AKIRA 发明人 FUJIWARA MAKOTO;ISHIMARU KAZUNARI;HOKAZONO AKIRA
分类号 H01L21/20;H01L21/336;H01L29/417;H01L29/45;H01L29/786 主分类号 H01L21/20
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