发明名称 |
POLISHING PAD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing pad which is excellent in durability and polishing property, where falling out of a semiconductor wafer or breakage of the polishing pad is prevented and a smooth polishing process is carried out by preventing exfoliation of a pad peripheral end part from a polishing plate and exfoliation of a polishing layer and a cushion layer for a long period in the case of polishing or dressing. <P>SOLUTION: The polishing pad used for chemical and mechanical polishing characteristically comprises a low order outer periphery whose height is lower than a polishing surface at the pad peripheral end. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006196836(A) |
申请公布日期 |
2006.07.27 |
申请号 |
JP20050009221 |
申请日期 |
2005.01.17 |
申请人 |
TOYO TIRE & RUBBER CO LTD;TRECENTI TECHNOLOGIES INC |
发明人 |
KIMURA TAKESHI;NAKAMORI MASAHIKO;OGAWA KAZUYUKI;TSUCHIYAMA YOJI;KAWAI AKINARI |
分类号 |
H01L21/304;B24B37/20;B24B53/017 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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