发明名称 POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad which is excellent in durability and polishing property, where falling out of a semiconductor wafer or breakage of the polishing pad is prevented and a smooth polishing process is carried out by preventing exfoliation of a pad peripheral end part from a polishing plate and exfoliation of a polishing layer and a cushion layer for a long period in the case of polishing or dressing. <P>SOLUTION: The polishing pad used for chemical and mechanical polishing characteristically comprises a low order outer periphery whose height is lower than a polishing surface at the pad peripheral end. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006196836(A) 申请公布日期 2006.07.27
申请号 JP20050009221 申请日期 2005.01.17
申请人 TOYO TIRE & RUBBER CO LTD;TRECENTI TECHNOLOGIES INC 发明人 KIMURA TAKESHI;NAKAMORI MASAHIKO;OGAWA KAZUYUKI;TSUCHIYAMA YOJI;KAWAI AKINARI
分类号 H01L21/304;B24B37/20;B24B53/017 主分类号 H01L21/304
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