发明名称 |
VERTICAL GATE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING IT |
摘要 |
PROBLEM TO BE SOLVED: To provide a vertical gate semiconductor device and a method for manufacturing it capable of reducing in size without increasing the contact resistance in a source region. SOLUTION: A first region 11 that functions as a transistor has a drain region 111, a body region 112 formed on the upper side of the drain region 111, a source region 113A formed on the upper side of the body region 112, and a trench formed in the body region 112 and in which a gate electrode 120 is embedded. A source region 113B is formed on the upper side of the body region 112 extending to a second region 12. The source regions 113A and 113B constituting the upper edge part of the trench are formed into a roundish shape. COPYRIGHT: (C)2006,JPO&NCIPI
|
申请公布号 |
JP2006196876(A) |
申请公布日期 |
2006.07.27 |
申请号 |
JP20050347998 |
申请日期 |
2005.12.01 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MIZOGUCHI SHUJI;TSUNODA KAZUAKI |
分类号 |
H01L29/78;H01L21/336;H01L21/8234;H01L27/06;H01L27/088;H01L29/866 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|