发明名称 Barrier structure for semiconductor devices
摘要 An opening in a dielectric layer having a unique barrier layer structure is provided. In an embodiment, the opening is a via and a trench. The barrier layer, which may comprise one or more barrier layers, is formed such that the ratio of the thickness of the barrier layers along a sidewall approximately midway between the bottom of the trench and the top of the dielectric layer to the thickness of the barrier layers along the bottom of the trench is greater than about 0.55. In another embodiment, the ratio of the thickness of the barrier layers along a sidewall approximately midway between the bottom of the trench and the top of the dielectric layer to the thickness of the barrier layers along the bottom of the via is greater than about 1.0. An underlying conductive layer may be recessed.
申请公布号 US2006163746(A1) 申请公布日期 2006.07.27
申请号 US20050042396 申请日期 2005.01.25
申请人 YU CHEN-HUA;PAN SHING-CHYANG;SHUE SHAU-LIN;HSIEH CHING-HUA;HUANG CHENG-LIN;LEE HSIEN-MING;LIN JING-CHENG 发明人 YU CHEN-HUA;PAN SHING-CHYANG;SHUE SHAU-LIN;HSIEH CHING-HUA;HUANG CHENG-LIN;LEE HSIEN-MING;LIN JING-CHENG
分类号 H01L23/48 主分类号 H01L23/48
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