| 摘要 |
An attenuated-total-reflection measurement apparatus 10 of the present invention collects light onto a contact surface between a sample and an ATR prim 14 at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus 10 comprises: a light-irradiating system 12 for emitting the light which is collected onto the contact surface; a photodetector 18 for detecting the total-reflection light from the contact surface; an aperture 20 for restricting the light which the photodetector 18 detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror 22 provided in a light path extending from the ATR prism 14 to the aperture 20 . The detection-side scanning mirror 22 is configured to allow the orientation of a reflecting surface thereof to be changed. And the measurement site in the contact surface, which is to be measured with the photodetector 18 , is changed by moving the reflecting surface of the detection-side scanning mirror 22 with respect to the total-reflection light from the contact surface, to perform mapping measurement in the contact surface.
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