TEST METHOD OF SEMICONDUCTOR MEMORY DEVICE,申请号KR20050006162-传众专利搜索

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发明名称	TEST METHOD OF SEMICONDUCTOR MEMORY DEVICE
摘要
申请公布号	KR20060085354(A)	申请公布日期	2006.07.27
申请号	KR20050006162	申请日期	2005.01.24
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	KIM, YOUNG HUN;MOON, BYUNG SIK
分类号	G11C29/00;G11C11/401	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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