发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device of chip-size in which the reliability of packaging is improved by improving soldering in packaging. SOLUTION: The semiconductor device comprises a base portion 11 composed of a rectangular metal plate, a metal base 10 provided with connection electrodes 15 arranged in both sides portions 12 formed in the both sides of the base portion 11, and a semiconductor chip 1 mounted on the base portion 11 of the metal base 10, wherein the packaging is performed using electrodes 7 and 8 which are formed on the surface of the semiconductor chip 1 and connection electrodes 15. The surface height of the connection electrodes 15 are made higher than that of the electrodes 7 and 8 of the semiconductor chip 1 by a given dimension. When mounted in the packaging substrate face down, the semiconductor chip 1 does not touch the packaging substrate preventing the semiconductor chip 1 to be mechanically damaged, and further a soldering layer is formed with configured minute spacing between the electrodes 7 and 8 and the packaging substrate, thereby the reliability of the soldering is enhanced. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006196927(A) 申请公布日期 2006.07.27
申请号 JP20060111476 申请日期 2006.04.14
申请人 NEC ELECTRONICS CORP 发明人 HOSOYA FUTOSHI
分类号 H01L23/12;H01L21/60 主分类号 H01L23/12
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