发明名称 LARGE AREA, UNIFORMLY LOW DISLOCATION DENSITY GaN SUBSTRATE AND PROCESS FOR MAKING THE SAME
摘要 <p>The invention provides a vapor phase growth process utilizing a growth reactor for forming a large area, uniformly low dislocation density single crystal III-V nitride material on a substrate, said process comprising: (i) a first phase including one or more steps of growing the III-V nitride material on the substrate by a vapor phase growth technique under pitted growth conditions; and (ii) a second phase including one or more steps of growing the III-V nitride material by the vapor phase growth technique under pit-filling conditions effecting closure of pits and annihilation of defects on a growth surface of the III-V nitride material, wherein the process further comprises at least one of the following items (a) and (b): (a) any of the first phase and the second phase comprises a flow of any of ammonia and hydrogen chloride to the growth reactor, and the second phase comprises a lower ratio of flow of ammonia to flow of hydrogen chloride relative to the first phase; and (b) upon conclusion of the second phase, the growth surface is essentially pit-free. The large area, uniformly low dislocation density single crystal III-V nitride material produced by such process is suitable for use as a substrate, for example for the fabrication of microelectronic and/or optoelectronic devices.</p>
申请公布号 EP1682701(A2) 申请公布日期 2006.07.26
申请号 EP20040811296 申请日期 2004.11.12
申请人 CREE, INC. 发明人 VAUDO, ROBERT, P.;XU, XUEPING
分类号 C30B25/02;C23C14/06;C23C16/30;C30B29/40;H01L21/20;H01L21/205;H01L33/00 主分类号 C30B25/02
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