发明名称 High speed serial interface test
摘要 A high speed, two-way serial interface with a scrambler and de-scrambler may be tested by sending a single word repeatedly through the scrambler to create a pseudo-random sequence. The pseudo-random sequence is then passed through the transmitter and looped back through the receiver of the serial interface. The pseudo-random sequence is then descrambled and compared to the input word. Since the input sequence is only a single word rather than a series of words, the comparison is very simple and capable of being performed within the serial interface itself without the need for external test equipment.
申请公布号 US7082557(B2) 申请公布日期 2006.07.25
申请号 US20030457850 申请日期 2003.06.09
申请人 LSI LOGIC CORPORATION 发明人 SCHAUER STEVEN;CAMPBELL KEVIN
分类号 G01R31/28;H04L12/42 主分类号 G01R31/28
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