发明名称 |
Apparatus and method for testing electrode structure for thin display device using FET function |
摘要 |
In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has a MISFET having a source, a gate and a drain. Then, a first voltage is applied to the target electrode such that a gate voltage is induced at the gate by electrostatic induction. Also, a second voltage is applied to at least one of the source and the drain such that current flows between the source and the drain based on the gate voltage. Then, a value of the current is examined to determine an electrical connection state of the target electrode.
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申请公布号 |
US7081908(B2) |
申请公布日期 |
2006.07.25 |
申请号 |
US20030717540 |
申请日期 |
2003.11.21 |
申请人 |
MITSUBISHI HEAVY INDUSTRIES, LTD. |
发明人 |
MURAKAWA SHINICHI;DOI TAKASHI;EGASHIRA YOSHIO;UEDA SHIGEO |
分类号 |
G09G3/36;G02F1/13;G09G3/00 |
主分类号 |
G09G3/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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