发明名称 |
Wafer piercing for forming e.g. rate gyro, involves moving pattern parts with respect to each other along direction parallel to wafer side and normal to side and plane intersection, to reduce thickness of lamella separating cavities |
摘要 |
The method involves subjecting a quartz wafer to an etching agent until complete piercing of the wafer at base of an etching pattern by assembly of two cavities (20.1, 20.2). Parts (19.1, 19.2) of the pattern are moved with respect to each other along a direction parallel to a wafer side and normal to an intersection of the wafer side with a slow etching plane in order to reduce thickness of a lamella separating the cavities. |
申请公布号 |
FR2880985(A1) |
申请公布日期 |
2006.07.21 |
申请号 |
FR20050005294 |
申请日期 |
2005.05.26 |
申请人 |
SAGEM SA SOCIETE ANONYME |
发明人 |
FEATONBY PAUL;LE ROY JEAN CLAUDE |
分类号 |
H01L21/302;B81C1/00;G01P15/02 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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