发明名称 Wafer piercing for forming e.g. rate gyro, involves moving pattern parts with respect to each other along direction parallel to wafer side and normal to side and plane intersection, to reduce thickness of lamella separating cavities
摘要 The method involves subjecting a quartz wafer to an etching agent until complete piercing of the wafer at base of an etching pattern by assembly of two cavities (20.1, 20.2). Parts (19.1, 19.2) of the pattern are moved with respect to each other along a direction parallel to a wafer side and normal to an intersection of the wafer side with a slow etching plane in order to reduce thickness of a lamella separating the cavities.
申请公布号 FR2880985(A1) 申请公布日期 2006.07.21
申请号 FR20050005294 申请日期 2005.05.26
申请人 SAGEM SA SOCIETE ANONYME 发明人 FEATONBY PAUL;LE ROY JEAN CLAUDE
分类号 H01L21/302;B81C1/00;G01P15/02 主分类号 H01L21/302
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