发明名称 STANDARD CALIBRATED LEAK
摘要 PROBLEM TO BE SOLVED: To provide a standard calibrated leak capable of solving the problems of a conventional art wherein the leak amount of the standard calibrated leak must be measured via other device and the measuring range of the leak amount is narrow. SOLUTION: The standard calibrated leak comprises a thin film that cannot pass measuring gas, and a permeation hole of the predetermined number of divisions formed in the thin film. The permeation hole has a predetermined aperture, and its aperture is within a nano range. The standard calibrated leak previously determines the dimension and the number of divisions, and the aperture is within the nano range. Therefore, the leak amount is calculated, based on the theory of vacuum science technology, namely the leak amount can be determined without using the other device, and a micro leak amount can be measured. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189425(A) 申请公布日期 2006.07.20
申请号 JP20050353744 申请日期 2005.12.07
申请人 KOFUKIN SEIMITSU KOGYO (SHENZHEN) YUGENKOSHI;QINGHUA UNIV 发明人 TANG JIE;LIU LIANG;RYU HO;KO SHOFUKU;DU BING-CHU;KAKU SAIRIN;CHIN HIKIN;FAN FENG-YAN
分类号 G01M3/02 主分类号 G01M3/02
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