发明名称 Smart lock-in circuit for phase-locked loops
摘要 The smart lock-in circuits basically include a sensor, two stacked PMOS transistors, two stacked NMOS transistors, and a feedback line. If the sensing voltage does not reach the expected voltage compared to the midpoint voltage of the sensor, the output voltage of the sensor turns on the corresponding transistor, which provides a current to its output until the voltage at feedback reaches the midpoint voltage. The time to reach the midpoint voltage at a filter is simply equal to the charge stored at the filter divided by the current, which can be scaled by a device aspect ratio of the transistor. Consequently, all smart lock-in circuits provide an initial loop condition closer to the expected loop condition according to schedule.
申请公布号 US2006158261(A1) 申请公布日期 2006.07.20
申请号 US20050036837 申请日期 2005.01.15
申请人 PARK SANGBEOM 发明人 PARK SANGBEOM
分类号 H03L7/00 主分类号 H03L7/00
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