| 摘要 |
A testing system for testing semiconductor devices, in particular for testing the functioning of BGA semi-conductor devices incorporated in a semiconductor module, comprising an analyzer and at least one measuring adaptor for establishing the electric connections between the analyzer and the semiconductor device, wherein the measuring adaptor comprises a region with electric contact points via which electric pins of the semiconductor device can be contacted, and at least one electric coupling via which the measuring adaptor can be connected to the analyzer, wherein the electric contact points and the electric coupling of the measuring adaptor are connected with each other via at least one flexible flat cable.
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