发明名称 Rare earth element-doped silicon/silicon dioxide lattice structure
摘要 Provided are an electroluminescence (EL) device and corresponding method for forming a rare earth element-doped silicon (Si)/Si dioxide (SiO2) lattice structure. The method comprises: providing a substrate; DC sputtering a layer of amorphous Si overlying the substrate; DC sputtering a rare earth element; in response, doping the Si layer with the rare earth element; DC sputtering a layer of SiO2 overlying the rare earth-doped Si; forming a lattice structure; annealing; and, in response to the annealing, forming nanocrystals in the rare-earth doped Si having a grain size in the range of 1 to 5 nanometers (nm). In one aspect, the rare earth element and Si are co-DC sputtered. Typically, the steps of DC sputtering Si, DC sputtering the rare earth element, and DC sputtering the SiO2 are repeated 5 to 60 cycles, so that the lattice structure includes the plurality (5-60) of alternating SiO2 and rare earth element-doped Si layers.
申请公布号 US2006160335(A1) 申请公布日期 2006.07.20
申请号 US20050039463 申请日期 2005.01.19
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 LI TINGKAI;GAO WEI;ONO YOSHI;HSU SHENG T.
分类号 H01L21/20;H01L33/26 主分类号 H01L21/20
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