| 摘要 |
Recesses ( 72 ), surface contours, contact tip modifications ( 52, 56 ), and/or other methods of ensuring pressure between a bottom surface ( 50 ) of a test plate ( 5 ) and top surfaces ( 52 ) of electrical contacts ( 18 ) are employed to enhance cleaning of the top surfaces ( 52 ) of the electrical contacts ( 18 ) to promote reliable measurements of DUTs ( 14 ).
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