发明名称 MODEL BASED TESTING FOR ELECTRONIC DEVICES
摘要 <p>The model-based method tests compliance of production devices with the performance specifications of a device design. The production devices are manufactured in accordance with the device design by a manufacturing process. In the method, a simple model form based on the device design and the performance specifications is developed (212), a stimulus for testing the production devices is specified (214) and each production device is tested (220). The model form has a basis function and model form parameters for the basis function. The model form parameters are dependent on the manufacturing process and differ in value among the production devices. A production device is tested by measuring (222) the response of the production device to the stimulus; extracting (224), using the model form, the values of the model form parameters for the production device from the measured response and the stimulus; and checking (226) compliance of the production device with the performance specifications using the extracted values of the model form parameters.</p>
申请公布号 WO2006076117(A2) 申请公布日期 2006.07.20
申请号 WO2005US45278 申请日期 2005.12.14
申请人 AGILENT TECHNOLOGIES, INC. 发明人 KHOCHE, AJAY;TUFILLARO, NICHOLAS, B.;JEFFERSON, STANLEY, T.;BARFORD, LEE, A.
分类号 G06F19/00 主分类号 G06F19/00
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