发明名称 MEASURING INSTRUMENT AND MEASURING METHOD FOR PHASE DELAY
摘要 <P>PROBLEM TO BE SOLVED: To provide a measuring instrument and a measuring method for a phase delay. <P>SOLUTION: This measuring instrument of the present invention includes a monochromatic light source part, a photodetecting part, a polarizing plate and a polarization spectroscopic part, the monochromatic light source part generates a pulse light beam, the photodetecting part is installed in one side of the monochromatic light source part, the polarizing plate is installed between the monochromatic light source part and the photodetecting part, and the polarization spectroscopic part is installed between the the polarizing plate and the photodetecting part. In this measuring method, a measured object is set between the polarizing plate and the polarization spectroscopic part, the monochromatic pulse light generated by monochromatic light source part is transmitted through the the polarizing plate to generate a polarized light, the polarized light is transmitted through the measured object to generate a phase-delayed light, the phase-delayed light is transmitted through the polarization spectroscopic part and the photodetecting part to measure a time difference between transmission times of extraordinary light and ordinary light, and a phase delay amount of the measured object is obtained after restoration. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189411(A) 申请公布日期 2006.07.20
申请号 JP20050073160 申请日期 2005.03.15
申请人 OPTIMAX TECHNOLOGY CORP 发明人 CHEN JVE-JONG;O HAKUHEI
分类号 G01J4/04;G01M11/00;G01N21/21;G02F1/1335 主分类号 G01J4/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利