发明名称 X-RAY FOREIGN SUBSTANCE-INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide easy maintenance for an X-ray foreign substance-inspection apparatus. SOLUTION: The X-ray foreign substance-inspection apparatus 1 for inspecting an object to be inspected for foreign substances, using X rays includes a cantilever frame 10 having one end as a free end and the other end as a support end, and supporting an X-ray detector 4 and a transfer mechanism 3 which moves the object to be inspected. Furthermore, a cover is employed therein, which covers the cantilever frame portion so as to open and close freely and has an instrument for keeping it closed. Using the cantilever frame provides a structure, having no support leg members on the side surface and the bottom surface of the X-ray foreign substance inspection apparatus 1, allows tools and replacement parts to be inserted into the X-ray foreign substance inspection apparatus without any interference with the supporting leg members, and allows easy maintenance, such as repair, cleaning, and parts replacement of a transfer belt 33, the X-ray detector or the like. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189460(A) 申请公布日期 2006.07.20
申请号 JP20060062993 申请日期 2006.03.08
申请人 SHIMADZU CORP 发明人 HANAMI HIDENORI;HIRANO TAKAHIDE;KIMURA TAKAO
分类号 G01N23/04;G01V5/00 主分类号 G01N23/04
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