发明名称 TEST PIECE HOLDING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a test piece holding device capable of semi-automatically discarding a test piece which has the hygienic problem or the risk of infection, after measurements without the need for coming into contact with the test piece. SOLUTION: The test piece holding device 100 is equipped with a rectangular substrate 102 having a recessed section on its upper surface, and a slide movable section 103 which is slidably set in the recessed section of the substrate 102. When measuring the test piece 101, the test piece 101 is held surely between the substrate 102 and the slide movable section 103. After the measurement, the test piece 101 is semi-automatically ejected out of the test piece holding device 100 by the slide action of the slide-movable section 103 relative to the substrate 102. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189428(A) 申请公布日期 2006.07.20
申请号 JP20050356938 申请日期 2005.12.09
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HAMANAKA KENICHI
分类号 G01N35/04 主分类号 G01N35/04
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