发明名称 MANUFACTURING METHOD OF STANDARD CALIBRATED LEAK
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a standard calibrated leak. SOLUTION: The manufacturing method of the standard calibrated leak comprises a step of preparing a substrate; a step of forming a thin film as a catalyst having a predetermined pattern on the substrate; a step of growing a one-dimensional nano structure of a predetermined dimension and the number of divisions in the catalyst layer; a step of forming a second thin film on the substrate in which the one-dimensional nano structure is grown; and a step of removing the one-dimensional nano structure on the second thin film, forming a permeation hole of the same dimension as that of the one-dimensional nano structure in the second thin film, and forming the standard calibrated leak. The leak amount is determined sufficiently by the standard calibrated leak, so that problems of the conventional art can be solved. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189419(A) 申请公布日期 2006.07.20
申请号 JP20050302127 申请日期 2005.10.17
申请人 KOFUKIN SEIMITSU KOGYO (SHENZHEN) YUGENKOSHI;QINGHUA UNIV 发明人 LIU LIANG;TANG JIE;RYU HO;KO SHOFUKU;DU BING-CHU;KAKU SAIRIN;CHIN HIKIN;GE SHUAI-PING;FAN FENG-YAN
分类号 G01M3/20;B82B3/00 主分类号 G01M3/20
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