| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can sufficiently activate the inside of a circuit at burn-in test, and to reduce the overhead of the circuits required for the burn-in test. SOLUTION: The semiconductor integrated circuit comprises sequential circuits 1 to 3, combinational circuits 4, 5, a scan test circuit 6, a storage circuit 7, a BIST circuit 8, and a selection circuit 9. In the BIST circuit 8, a control circuit 81 is provided which writes burn-in test data to a predetermined storage area of the storage circuit 7. The selection circuit 9, at the time of the burn-in test, selects the burn-in test data written to the storage circuit 7 and distributes it into the sequential circuits 1 to 3. COPYRIGHT: (C)2006,JPO&NCIPI
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