发明名称 DEVICE FOR NEUTRAL PARTICLE RAY BEAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a device for a neutral particle ray beam in which, although neutralization of particle beam is necessary for adjusting processing shapes precisely, this neutralization can be controlled independently from forming conditions and processing conditions of the ion beams, and a high quality neutral particle beam can be obtained. <P>SOLUTION: This is a device for a neutral particle ray beam having a plasma chamber 1 for forming plasma and emitting ion beams, a capillary part 2 for neutralizing ion beams, and a processing chamber 3 for irradiating the beams passing the capillary part on the processed object. The capillary part has a means which supplies and exhausts neutral gas into and from the capillary and a control means which controls these and establishes the neutral gas pressure to a prescribed value. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006190617(A) 申请公布日期 2006.07.20
申请号 JP20050002831 申请日期 2005.01.07
申请人 FUJITSU LTD 发明人 WAKANA SHINICHI
分类号 H05H3/02;G21K1/00;G21K5/00;G21K5/02;G21K5/04;H01J27/16;H01J37/04;H01J37/08;H05H1/24 主分类号 H05H3/02
代理机构 代理人
主权项
地址