发明名称 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RELIEF PATTERN AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition capable of giving a polyimide film by a low-temperature process, a pattern forming method using the photosensitive resin composition, and a semiconductor device with a film produced from the photosensitive resin composition. <P>SOLUTION: The photosensitive resin composition for forming a polyimide pattern on a substrate comprises (a) a polyamic acid, (b) a photobase generator which generates a secondary amine having at least one substituent in the &alpha; position upon irradiation with an actinic ray, and (c) a solvent. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189591(A) 申请公布日期 2006.07.20
申请号 JP20050000950 申请日期 2005.01.05
申请人 TOKYO INSTITUTE OF TECHNOLOGY;ASAHI KASEI ELECTRONICS CO LTD 发明人 UEDA MITSURU;SHIBAZAKI YUJI;FUKUKAWA KENICHI;IKEDA AKIHIKO;HANABATAKE HIROYUKI
分类号 G03F7/038;G03F7/004;G03F7/38;G03F7/40;H01L21/027 主分类号 G03F7/038
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