发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RELIEF PATTERN AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition capable of giving a polyimide film by a low-temperature process, a pattern forming method using the photosensitive resin composition, and a semiconductor device with a film produced from the photosensitive resin composition. <P>SOLUTION: The photosensitive resin composition for forming a polyimide pattern on a substrate comprises (a) a polyamic acid, (b) a photobase generator which generates a secondary amine having at least one substituent in the α position upon irradiation with an actinic ray, and (c) a solvent. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006189591(A) |
申请公布日期 |
2006.07.20 |
申请号 |
JP20050000950 |
申请日期 |
2005.01.05 |
申请人 |
TOKYO INSTITUTE OF TECHNOLOGY;ASAHI KASEI ELECTRONICS CO LTD |
发明人 |
UEDA MITSURU;SHIBAZAKI YUJI;FUKUKAWA KENICHI;IKEDA AKIHIKO;HANABATAKE HIROYUKI |
分类号 |
G03F7/038;G03F7/004;G03F7/38;G03F7/40;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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