发明名称 RECESS GATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE EQUIPPED THEREWITH
摘要 PROBLEM TO BE SOLVED: To provide a recess gate which can reduce the height of a recess gate without generating voids in the vapor deposition of a gate electrode substance to be buried in a recess, and to provide a method for manufacturing a semiconductor device equipped with the same. SOLUTION: The recess gate contains a silicon substrate, a recess pattern formed by having a predetermined depth in the predetermined part of the silicon substrate, a gate insulating film formed on the surface of the recess pattern, a gate poly-silicon film formed on the surface of the gate insulating film, a gate metal film formed on the surface of the gate poly-silicon film and formed so as to bury the recess pattern, and a gate hard mask formed on the gate metal film. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006190947(A) 申请公布日期 2006.07.20
申请号 JP20050170860 申请日期 2005.06.10
申请人 HYNIX SEMICONDUCTOR INC 发明人 YU JAE-SEON;KONG PHIL-GOO
分类号 H01L29/78;H01L21/28;H01L29/423;H01L29/49 主分类号 H01L29/78
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