发明名称 PROBE FOR SCANNING OVER A SUBSTRATE AND DATA STORAGE DEVICE
摘要 A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as electrical contacts an being during operation of the probe mechanically fixed to a probe-holding structure, which may be a common frame of the data storage device. A probe further comprises a supporting structure, to which the terminals are mechanically directly coupled or coupled via hinges and which extends away from the terminals. A tip with a nanoscale apex is provided. A beam structure comprises a heating resistor and is attached at ends to the supporting structure. The beam structure is thinned at least in a direction parallel to an axis of the tip compared to an area of the supporting structure abutting the beam structure.
申请公布号 KR20060082796(A) 申请公布日期 2006.07.19
申请号 KR20060001747 申请日期 2006.01.06
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ALBRECHT THOMAS;DESPONT MICHEL;DUERIG URS T.;LANTZ MARK A.;ROTHUIZEN HUGO E.;WIESMANN ROTHUIZEN DOROTHEA W.
分类号 G11B9/14;G01Q70/14;G01Q80/00 主分类号 G11B9/14
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