发明名称 Thermal flux deposition by scanning
摘要 A substrate is initially positioned in the reaction chamber. One or more gases are introduced into the reaction chamber. A predetermined speed for translating a line of radiation is determined. Continuous wave electromagnetic radiation is then emitted from a continuous wave radiation source. The continuous wave electromagnetic radiation is subsequently focused into a line of radiation extending across the surface of the substrate. The line of radiation is then translated relative to the surface at the constant predetermined speed. The combination of the introduced gas/es and heat generated by the line of radiation causes the gas/es to react and deposit a layer on the surface of the substrate. Undesirable byproducts of the reaction are then flushed from the reaction chamber. This process is repeated until a layer having a predetermined thickness is formed on the surface of the substrate.
申请公布号 US7078651(B2) 申请公布日期 2006.07.18
申请号 US20020202119 申请日期 2002.07.23
申请人 APPLIED MATERIALS INC. 发明人 JENNINGS DEAN
分类号 B23K26/08;B23K26/03;B23K26/06;B23K26/12;B23K26/34;C23C8/00;C23C8/10;C23C8/22;C23C16/04;C23C16/48;H01L21/20 主分类号 B23K26/08
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