发明名称 Method of manufacturing compound semiconductor wafer
摘要 Compound-semiconductor-wafer manufacturing whereby particle adherence, and obverse-surface oxidization and alteration are slight and the use of organic solvents is reduced. An adsorption pad is bonded to a polishing plate, and a wafer being adsorbed onto the adsorption pad without using wax is polished and thereafter stored within purified water without drying. Since storage is within purified water, particle adherence, and obverse-surface oxidization and alteration turn out to be slight, yielding a high-quality wafer. In the cleaning procedure following the aquatic storage, organic solvent washing is omitted. This allows the use/waste volume of noxious organic solvent to be reduced.
申请公布号 US7078343(B2) 申请公布日期 2006.07.18
申请号 US20020258414 申请日期 2002.10.19
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 OKAMOTO TAKATOSHI;MEZAKI YOSHIO;MORIMOTO TOSHIYUKI
分类号 H01L21/302;H01L21/304;B24B37/04;H01L21/306;H01L21/461 主分类号 H01L21/302
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