发明名称 |
Field effect transistor semiconductor device |
摘要 |
A semiconductor device has: a buffer layer formed on a conductive substrate and made of Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N with a high resistance; an element-forming layer formed on the buffer layer, having a channel layer, and made of undoped GaN and N-type Al<SUB>y</SUB>Ga<SUB>1-y</SUB>N; and a source electrode, a drain electrode and a gate electrode which are selectively formed on the element-forming layer. The source electrode is filled in a through hole provided in the buffer layer and the element-forming layer, and is thus electrically connected to the conductive substrate.
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申请公布号 |
US7078743(B2) |
申请公布日期 |
2006.07.18 |
申请号 |
US20040834362 |
申请日期 |
2004.04.29 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
MURATA TOMOHIRO;HIROSE YUTAKA;IKEDA YOSHITO;TANAKA TSUYOSHI;INOUE KAORU;UEDA DAISUKE;UEMOTO YASUHIRO |
分类号 |
H01L31/0328;H01L21/20;H01L21/28;H01L21/338;H01L29/20;H01L29/417;H01L29/778;H01L29/812;H01S5/30 |
主分类号 |
H01L31/0328 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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