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发明名称
具有复合式衬垫之浅沟渠隔离元件的形成方法
摘要
本发明系揭露一种具有复合式衬垫之浅沟渠隔离元件的形成方法,其系在一半导体基底表面形成一垫氧化层与氮化矽罩幕层后,利用蚀刻技术形成浅沟渠,再于浅沟渠内表面依序沈积一氮化矽层及一原位蒸气产生(ISSG)氧化层,最后在浅沟渠中填满一层氧化物,以形成浅沟渠隔离元件。本发明之方法系可解决凹陷现象之问题,减少扭曲效应的产生,并藉此增进元件电性。
申请公布号
TW200625516
申请公布日期
2006.07.16
申请号
TW093140957
申请日期
2004.12.28
申请人
上海宏力半导体制造有限公司 GRACE SEMICONDUCTOR MANUFACTURING CORPORATION 中国
发明人
江瑞星;马惠平
分类号
H01L21/76
主分类号
H01L21/76
代理机构
代理人
林火泉
主权项
地址
中国
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