发明名称 CHEMICAL MECHANICAL PLANARIZATION PAD
摘要 A chemical Mechanical Planarization (CMP) Pad. The CMP pad may be hydrophobic due to the incorporation of metal complexing agents. The CMP pad substantially retaining planarization characteristics throughout planarization applications. Shearing, hardness, wearing, water absorbtion and electrical characteristics of the CMP pad remain substantially constant during CMP applications.
申请公布号 WO2005049269(A3) 申请公布日期 2006.07.13
申请号 WO2004US38043 申请日期 2004.11.15
申请人 ADVANCED TECHNOLOGY MATERIALS, INC.;BAUM, THOMAS, H. 发明人 BAUM, THOMAS, H.
分类号 H01L21/302;B24B;H01L21/321;H01L21/461 主分类号 H01L21/302
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