发明名称 FILM DEPOSITION APPARATUS, FILM DEPOSITION METHOD, MULTILAYER FILM REFLECTION MIRROR AND EUV EXPOSURE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a multilayer film reflection mirror having the desired multilayer film period length, and its manufacturing apparatus (a film deposition apparatus). <P>SOLUTION: Contribution of an inner surface of an aperture as a shielding part is d&times;sin&theta;, where d denotes the thickness of a film thickness correction plate, and &theta; denotes an angle of inclination. When the thickness is 0.5 mm, and the film thickness correction plate is inclined by 30&deg;, the aperture ratio is reduced to about 71% compared with a case in which the film thickness correction plate is not inclined. When the thickness is reduced to 0.4 mm by grinding a part of the film thickness correction plate, the reduction range of the aperture ratio is reduced and the aperture ratio is reduced to about 77% compared with a case in which the film thickness correction plate is not inclined. The thickness of a center portion is 0.5 mm, the thickness is gradually reduced toward a peripheral part, and if the thickness is 0.4 mm in an outermost peripheral part, the film thickness correction plate is inclined by 30&deg;, film deposition can be performed while the aperture ratio of the peripheral part is larger by about 8% than that of the peripheral part. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006183093(A) 申请公布日期 2006.07.13
申请号 JP20040377728 申请日期 2004.12.27
申请人 NIKON CORP 发明人 KAMITAKA NORIAKI
分类号 C23C14/54;C23C14/46;G02B5/08;G03F7/20;G21K1/06;G21K5/02;H01L21/027 主分类号 C23C14/54
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