发明名称 |
HETERO-EPITAXIAL SEMICONDUCTOR SUBJECTED TO INTERNAL GETTERING AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide an SOI wafer and a method of manufacturing the wafer. SOLUTION: The SOI wafer is a hetero-epitaxial semiconductor wafer having a front surface and a back surface, a center plane between the front surface and the back surface, and a circumferential edge connecting between the front surface and the back surface; and including a first material. Further, the semiconductor wafer has a hetero-epitaxial layer forming the front surface of the wafer, and including a second material having a crystal structure different from that of the first material; a surface layer including the first material rather than the second material and being adjacent to the hetero-epitaxial layer; and a bulk layer including the first material rather than the second material and extending through the center plane adjacently to the surface layer. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006186312(A) |
申请公布日期 |
2006.07.13 |
申请号 |
JP20050282144 |
申请日期 |
2005.09.28 |
申请人 |
MEMC ELECTRON MATERIALS INC |
发明人 |
SEACRIST MICHAEL R;WILSON GREGORY M;STANDLEY ROBERT W |
分类号 |
H01L21/20;H01L21/02;H01L21/322;H01L27/12 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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