发明名称 HETERO-EPITAXIAL SEMICONDUCTOR SUBJECTED TO INTERNAL GETTERING AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide an SOI wafer and a method of manufacturing the wafer. SOLUTION: The SOI wafer is a hetero-epitaxial semiconductor wafer having a front surface and a back surface, a center plane between the front surface and the back surface, and a circumferential edge connecting between the front surface and the back surface; and including a first material. Further, the semiconductor wafer has a hetero-epitaxial layer forming the front surface of the wafer, and including a second material having a crystal structure different from that of the first material; a surface layer including the first material rather than the second material and being adjacent to the hetero-epitaxial layer; and a bulk layer including the first material rather than the second material and extending through the center plane adjacently to the surface layer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006186312(A) 申请公布日期 2006.07.13
申请号 JP20050282144 申请日期 2005.09.28
申请人 MEMC ELECTRON MATERIALS INC 发明人 SEACRIST MICHAEL R;WILSON GREGORY M;STANDLEY ROBERT W
分类号 H01L21/20;H01L21/02;H01L21/322;H01L27/12 主分类号 H01L21/20
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