| 摘要 |
A method and apparatus utilizing defect memories is based on damaged section blocks corresponding high bit address division types. A switch set is used to reset an electrical connecting mode between high bit address input end and high bit address output end of the control chip such that high bit address signal sent from the data access system can keep away from damaged section blocks of the defect memories and be transmitted to good section blocks to allow multiple defect memories with different registered section blocks being able to be utilized.
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