发明名称 LITHOGRAPHY APPARATUS, ILLUMINATION SYSTEM, AND DEBRIS TRAPPING SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a debris trapping system that allows for a high pressure of a buffer gas in relation to a source gas to enhance the probability that the debris particles are trapped by the system while simultaneously allowing for high transmission of radiation through the system. <P>SOLUTION: A debris trapping system for trapping debris particles released with the generation of radiation by a radiation source in a lithography apparatus includes first and second sets of channels. Each channel of the first set enables radiation from a radiating source to propagate therethrough, and has an inner wall for catching debris particles. The second set of channels is situated downstream of the first set with respect to a propagation direction of the radiation. Each channel of the second set enables radiation from the radiating source to also propagate therethrough and has an inner wall for catching debris particles. A gas supply and a gas exhaust are configured to provide between the first set and the second set of channels a gas flow having a net flow direction substantially across the propagation direction of the radiation from a radiating source. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006186366(A) 申请公布日期 2006.07.13
申请号 JP20050371917 申请日期 2005.12.26
申请人 ASML NETHERLANDS BV 发明人 LEVINUS PIETER BAKKER;KLUNDER DERK JAN WILFRED;VAN HERPEN MAARTEN MARINUS JOHANNES WILHELMUS
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址