发明名称 |
LITHOGRAPHY APPARATUS, ILLUMINATION SYSTEM, AND DEBRIS TRAPPING SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a debris trapping system that allows for a high pressure of a buffer gas in relation to a source gas to enhance the probability that the debris particles are trapped by the system while simultaneously allowing for high transmission of radiation through the system. <P>SOLUTION: A debris trapping system for trapping debris particles released with the generation of radiation by a radiation source in a lithography apparatus includes first and second sets of channels. Each channel of the first set enables radiation from a radiating source to propagate therethrough, and has an inner wall for catching debris particles. The second set of channels is situated downstream of the first set with respect to a propagation direction of the radiation. Each channel of the second set enables radiation from the radiating source to also propagate therethrough and has an inner wall for catching debris particles. A gas supply and a gas exhaust are configured to provide between the first set and the second set of channels a gas flow having a net flow direction substantially across the propagation direction of the radiation from a radiating source. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006186366(A) |
申请公布日期 |
2006.07.13 |
申请号 |
JP20050371917 |
申请日期 |
2005.12.26 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
LEVINUS PIETER BAKKER;KLUNDER DERK JAN WILFRED;VAN HERPEN MAARTEN MARINUS JOHANNES WILHELMUS |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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