发明名称 VARIABLE CONSTANT TEMPERATURE TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress pulsation of refrigerant which is caused at the time of cycle switching. SOLUTION: A high temperature-side refrigerant circuit 20 is connected to a low temperature-side refrigerant circuit 30 through a cascade heat exchanger 40. The low temperature-side circuit 30 comprises a low temperature-side condenser 32 connected in parallel to the cascade heat exchanger 40. The refrigerant of the low temperature-side refrigerant circuit 30 is condensed in a low-temperature side condenser 32 in single-stage refrigerating cycle, and condensed in the cascade heat exchanger 40 in secondary refrigerating cycle. A liquid storage 33 which absorbs the pulsation of refrigerant caused by pressure fluctuation in cycle switching is provided on the upstream of low temperature-side expansion valves 34a and 34b. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006183980(A) 申请公布日期 2006.07.13
申请号 JP20040381435 申请日期 2004.12.28
申请人 DAIKIN IND LTD 发明人 TOBAYAMA HIROKI
分类号 F25B1/00;F25B7/00 主分类号 F25B1/00
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